| Patent Number |
Title Of Patent |
Date Issued |
| D343800 |
Electronic measuring/monitoring instrument |
February 1, 1994 |
|
| D343799 |
Electronic measuring/monitoring instrument |
February 1, 1994 |
|
| 7425837 |
Spatial transformer for RF and low current interconnect |
September 16, 2008 |
| A spatial transformer includes an insulating substrate; a plurality of test terminal assemblies on the substrate; and a plurality of contact surfaces on the transformer, each providing an interconnection point for electrical connection between a respective test terminal assembly and a |
| 7414414 |
Spatially distributed guarded impedance |
August 19, 2008 |
| A guarded sense impedance for use in a measurement instrument includes a sense impedance adapted to have a spatially distributed electrical potential and at least one guard structure adapted to have the spatially distributed electrical potential. The guard structure is arranged to pr |
| 7388366 |
Test system connection system with triaxial cables |
June 17, 2008 |
| A connection system for connecting test equipment to a device under test (DUT) includes a first pair of equal-length triaxial cables, each having a desired characteristic impedance between a center conductor and an outer conductor, the outer conductor of each first cable being connected |
| 7342401 |
Measurement bias tee |
March 11, 2008 |
| A bias tee for connecting a measurement device to a DUT, where the measurement device has a guard output, includes a DC port; a HF port; and a measurement port. The HF input port is guarded with the guard output during operation of the bias tee. |
| 7280929 |
Method and apparatus for pulse I-V semiconductor measurements |
October 9, 2007 |
| A method for measuring a value of an electrical characteristic of a device under test in a circuit having a load impedance includes applying a voltage to said circuit, the voltage having a selected amplitude; measuring a current in the circuit in response to the voltage; calculating |
| 7276893 |
Automatic ranging current shunt |
October 2, 2007 |
| A range-changing circuit includes an array of graduated impedances in serial relationship, and a voltage sensing and limiting switch across one of said impedances. The switch limits the voltage across said one of the impedances in response to a voltage sensed by the switch. |
| 7240258 |
Parallel test system and method |
July 3, 2007 |
| A parallel test device for testing a DUT includes a controller that has a test procedure useful for both sequential and parallel testing, a test regimen that includes a parallel procedure, and a parallel wrapper applied to the test procedure to provide the parallel procedure; and a p |
| 7224160 |
RF and pulse bias tee |
May 29, 2007 |
| A RF and pulse bias tee for use with a source measure unit (SMU) includes a SMU source terminal; a SMU measure terminal; an output terminal; a SMU measure terminal pulse/RF block between the SMU measure terminal and the output terminal; a SMU source terminal high frequency block having t |
| 7205773 |
Method for calibrating a pulsed measurement system |
April 17, 2007 |
| A method for calibrating a pulsed measurement system, the system having a pulse generator unit, a measurement unit and a probe unit having a first and a second probe tip. The first tip, the pulse generator unit and the measurement unit are all interconnected by respective cables to a pow |
| 7202676 |
Source measure circuit |
April 10, 2007 |
| A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the |
| 7009486 |
Low noise power transformer |
March 7, 2006 |
| A printed circuit board transformer has primary and secondary windings. The transformer includes a printed circuit board having a plurality of traces forming a plurality of first portions of the primary and secondary windings, an annular magnetic core adjacent to the printed circuit boar |
| 6900649 |
High frequency RF interconnect for semiconductor automatic test equipment |
May 31, 2005 |
| A RF test interconnection system for connecting a measurement device to a device under test includes, a probe card having a probe extending from a first side of the card for making electrical contact with the device under test and a coaxial connector extending from a second side of the c |
| 6522158 |
Non-contact mobile charge measurement with leakage band-bending and dipole correction |
February 18, 2003 |
| Corona charges are used to bias a wafer to push down mobile charges and then pull them up during temperature cycles. Mobile charge is measured from the drops in the corona voltage due to the mobile charges. Corrections are made in the measurements for dipole potentials, leakage and s |
| 6204647 |
Battery emulating power supply |
March 20, 2001 |
| A power supply is provided with independently adjustable voltage and current sources to provide a power supply having a desired voltage-current relationship to a device under test. This allows the control of the power supply output impedance as seen by the device under test and the emula |
| 6069484 |
Source measure unit current preamplifier |
May 30, 2000 |
| A bi-directional current scaling preamplifier is inserted between a device under test and a source measure unit or a source measure unit and switching matrix combination. The bi-directional current scaling preamplifier is formed from an operational amplifier, a range-changing network |
| 5999002 |
Contact check for remote sensed measurement |
December 7, 1999 |
| A contact resistance check circuit and method for verifying that a sufficient electrical connection is established between a source and a sense lead of a Kelvin connection. The circuit includes a microprocessor for driving a transformer that is connected to the source/sense probe (i. |
| 5994947 |
Low leakage solid state switch |
November 30, 1999 |
| A low leakage solid state switch for range-changing uses a pair of low leakage diodes switched to a reference voltage to block leakage through the switch when it is in the "off" state. |
| 5918194 |
Integrated modular measurement system having configurable firmware architecture and modular mech |
June 29, 1999 |
| An integrated modular measurement system includes a universal module which is operable to receive measurement data from one or more measurement sensors, convert the measurement data into a value that represents a characteristic being measured and indicate the value to a user in a plu |
| 5886530 |
Test contact connection checking method and circuit |
March 23, 1999 |
| A contact resistance check circuit and method for verifying that a sufficient electrical connection is established between a source and a sense lead of a Kelvin connection. The circuit includes a microprocessor for driving a transformer that is connected to the source/sense probe (i. |
| 5834941 |
Mobile charge measurement using corona charge and ultraviolet light |
November 10, 1998 |
| Corona charge is applied to an oxide layer on a semiconductor wafer. Then ultraviolet light is used to erase a grid pattern of the corona charge. Opposite polarity corona charge is then applied to the layer, resulting in a grid of field-induced PN junctions. The surface photovoltage of t |
| 5808475 |
Semiconductor probe card for low current measurements |
September 15, 1998 |
| A semiconductor probe card is provided with low dielectric absorption feed-through contacts to isolate test lines from printed circuit board leakage effects. |
| 5661310 |
Radiation dose mapping systems and methods |
August 26, 1997 |
| A dose distribution analyzer (20) and methods for providing a radiation dose map indicating energy of a spacially variable radiation pattern beamed onto a dose map radiation dosimeter (10). The radiation dosimeter (10) is exposed to a proposed spacially variable radiation pattern such as |
| 5644115 |
Relay matrix switching assembly |
July 1, 1997 |
| A matrix of three pole, high speed, low current relays for connecting test equipment to a device under test is provided with improved interconnect buses. The relays are mounted in rows and columns with their three pairs of leads extending vertically. An input interconnect bar having thre |
| 5606250 |
Measurement device with common mode current cancellation |
February 25, 1997 |
| The secondary of a line powered transformer supplies power to a measurement unit. The measurement unit measures between a high test terminal and a low terminal on the secondary. The low terminal is connected to a low test terminal through a common mode current sensor to a device under te |
| 5594247 |
Apparatus and method for depositing charge on a semiconductor wafer |
January 14, 1997 |
| A conductive screen is placed between a corona gun and the surface of a semiconductor wafer. The charge deposited on the wafer by the gun is controlled by a potential applied to the screen. A chuck orients the wafer in close proximity to the screen. A desired charge is applied to the waf |
| 5559482 |
Dual shielded relay reed pack |
September 24, 1996 |
| A reed relay is provided with two shields. The shields are fabricated from copper foil and insulated from each other by polyester tape or film. One shield is connected to one lead of a switching element and the other shield is connected to another lead of a switching element. The shields |
| 5519328 |
Compensation for dielectric absorption effect |
May 21, 1996 |
| Apparatus is provided for continuously compensating for the dielectric absorption effect in a measuring capacitor in a circuit which employs means for charging the capacitor to develop an output signal thereacross and wherein the absorption effect causes an error in the output signal |
| 5508526 |
Dual entrance window ion chamber for measuring X-ray exposure |
April 16, 1996 |
| A dual entrance window ion chamber is provided for purposes of measuring x-ray exposure. The ion chamber includes a housing having a cavity formed therein and which defines an ion chamber. The housing has oppositely disposed first and second openings therein located on opposite sides of |
| 5386188 |
In-circuit current measurement |
January 31, 1995 |
| A current in a circuit is measured without breaking the circuit. A relatively low resistance element in the circuit such as a component lead is chosen. A current is forced through the element and the voltage drop measured. Another current is forced through the element and the voltage |
| 5146100 |
High voltage solid-state switch with current limit |
September 8, 1992 |
| Two enhancement mode MOSFETs in series are used to provide a solid-state switch. The MOSFETs are turned on by a photovoltaic array. Resistors in series with the MOSFETs serve to provide a control voltage to current-limit the circuit. An additional photovoltaic array is used to supply |
| 5144154 |
Range changing using N and P channel FETS |
September 1, 1992 |
| A range selecting impedance is switched into or out of a parallel range-selecting network by connecting the impedance across the network through an n-channel and a p-channel FET connected in parallel output configuration. The n-channel FET does the switching if the drains are negativ |
| 5103389 |
Frequency range of analog converter by means of external rectifier |
April 7, 1992 |
| The frequency range and accuracy of a commercially available RMS converter is improved by providing an improved rectifier ahead of the converter's internal rectifier. The improved rectifier switches between the input signal and an inverted version of the input signal in response to a hig |
| 5039934 |
Control for voltage/current source with current/voltage limiting |
August 13, 1991 |
| An apparatus capable of acting as a current-limited voltage source or a voltage-limited current source is disclosed. The output of the apparatus is provided by a differential amplifier. The current and voltage outputs are compared to positive and negative current and voltage limits. |
| 4916727 |
Apparatus for measuring the voltage applied to a radiation source |
April 10, 1990 |
| Apparatus is provided for use in detecting the input voltage applied to a radiation source operating at an unknown voltage within a given voltage range. The apparatus includes a set of radiation absorbing filters including a first filter which includes a first chemical element and a |
| 4843619 |
Apparatus for measuring the peak voltage applied to a radiation source |
June 27, 1989 |
| Apparatus is provided for use in detecting the peak voltage applied to a radiation source operating at an unknown input voltage. The apparatus includes a set of radiation absorbing filters including a first filter which includes a first element that exhibits a known K-absorption edge and |
| 4598253 |
JFET ohmic differential amplifier |
July 1, 1986 |
| The JFET transistor differential amplifier herein serves as an input stage, as for an electrometer operational amplifier, and exhibits high input impedance and low leakage current. This is achieved by biasing the JFET transistors so as to operate in the ohmic region rather than the s |
| 3979642 |
Electronic protective circuit |
September 7, 1976 |
| Electronic protective circuitry for protecting an electrical circuit, such as a constant current source circuit, from damage due to an overvoltage applied to the circuit. The protective circuit employs circuitry for limiting the magnitude of the voltage across a first portion of the |
