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IMEC vzw Patents |
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Assignee: IMEC vzw
Address: Leuven, BE
No. of patents: 51
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 5723981 |
Method for measuring the electrical potential in a semiconductor element |
March 3, 1998 |
| Measuring an electrical potential in a semiconductor element by applying one or more voltages over the semiconductor element, placing one or more conductors in contact with the semi-conductor element using a scanning proximity microscope, calibrating the contact force between the conduct |
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