| Patent Number |
Title Of Patent |
Date Issued |
| D569287 |
Water quality measurement probe |
May 20, 2008 |
|
| D568775 |
Water quality indicator |
May 13, 2008 |
|
| D549827 |
Blood analyzer |
August 28, 2007 |
|
| D496677 |
Combined radiation thermometer and camera |
September 28, 2004 |
|
| D496600 |
PH electrode |
September 28, 2004 |
|
| D494079 |
Indicator for water quality measuring instrument |
August 10, 2004 |
|
| D493738 |
Indicator for water quality measuring instrument |
August 3, 2004 |
|
| D346561 |
Rainfall sampling apparatus |
May 3, 1994 |
|
| 7427378 |
Analysis method and apparatus for sulfur component using ultraviolet fluorescence |
September 23, 2008 |
| An analysis method and analysis apparatus involve analysis for a sulfur component using ultraviolet fluorescence capable of removing the interferential influence of NO with good efficiency and certainty to thereby measure a concentration of only sulfur components such as SO.sub.2 and |
| 7424372 |
Method and apparatus for measuring physical or chemical phenomena |
September 9, 2008 |
| The present invention relates to a method of measuring a physical or chemical phenomenon by feeding electric charge from an charge feeding portion to a sensing portion having potential changed depending on the magnitude of physical or chemical amount, removing the fed electric charge |
| 7397094 |
Semiconductor device and manufacturing method thereof |
July 8, 2008 |
| To provide a semiconductor device that enables to suppress a defect density of a gate insulating film of an MISFET, gain a sufficient electric characteristic thereof, and make an Equivalent Oxide Thickness (EOT) of the gate insulating film 1.0 nm or less. The MISFETs are formed to ha |
| 7395725 |
Sample treatment apparatus and sample measurement apparatus providing it |
July 8, 2008 |
| There is provided a sample treatment apparatus which can, continuously and stably for a long time, treat a sample containing an easily precipitating substance such as sulfur and a measuring apparatus providing it. The sample treatment apparatus includes: a path for introducing a fluid fo |
| 7387764 |
Contained oxygen analyzing apparatus and contained analyzing method |
June 17, 2008 |
| An apparatus for analyzing the amount of gas in a solid sample such as a contained oxygen analyzing apparatus and method utilizing a preliminary reducing furnace which can be connected to an analyzing furnace by a transfer unit. A sample such as steel can be reduced in the preliminary |
| 7380476 |
Gas sampling bag |
June 3, 2008 |
| A gas sampling bag is capable of blowing out the gas uniformly into the bag main body, and filling the bag main body with gas in a securely mixed state. A gas sampling bag that is connected to a constant volume sampling passage, contains a pipe, on which a plurality of gas inlet/outlet h |
| 7328606 |
Exhaust gas measuring device and method for measuring exhaust gas |
February 12, 2008 |
| With the exhaust gas measuring device and the exhaust gas measuring method, the workload of the internal combustion engine is calculated based on a discharged amount of a component related to a carbon compound such as CO, CO.sub.2 and THC in the exhaust gas discharged from the intern |
| 7327444 |
Substrate inspection apparatus and method |
February 5, 2008 |
| The present invention provides a method and substrate examining device that sequentially and automatically measures at least the thickness and the internal stress of the thin film at a predetermined measurement point on the surface of every manufactured semiconductor substrate to perform |
| 7326579 |
Immunoassay method for lyzed whole blood |
February 5, 2008 |
| The present invention provides an immunoassay method in which blood can be measured even without pretreatment by means of a centrifuge etc. In the present invention, antibodies or antigens in a sample are subjected to agglutination reaction with insoluble carriers onto which antigens or |
| 7314541 |
Ion measuring composite electrode |
January 1, 2008 |
| The present invention provides an improved ion measuring composite electrode, measuring instrument incorporating the composite electrode, and a manufacturing method for forming a preform of a composite double glass pipe for forming the ion measuring composite electrode. A hollow inne |
| 7295307 |
Method of and apparatus for measuring stress of semiconductor material |
November 13, 2007 |
| The present invention provides a method of and a device for measuring the stress in a semiconductor material. An excitation light is irradiated on a semiconductor material formed with a silicon germanium layer and a strained silicon layer in a multilayer structure on a single crystal |
| 7280210 |
Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and |
October 9, 2007 |
| An ellipsometer measures any point of a sample by a first spectrometer and a second spectrometer. The ellipsometer performs analysis based on the measurement results obtained by the first spectrometer, performs analysis based on the measurement results obtained by the second spectrometer |
| 7280208 |
Optical characteristic analysis method, sample measuring apparatus and spectroscopic ellipsomete |
October 9, 2007 |
| The spectroscopic ellipsometer, by a computer program incorporated therein, applies voltage to a sample placed on a stage, with a power supply device and conducting probe stands, polarizes multi-wavelength light, with a light polarizer, generated by a xenon lamp and irradiates the po |
| 7271901 |
Thin-film characteristic measuring method using spectroellipsometer |
September 18, 2007 |
| The present invention provides a thin film property measuring method using a spectroscopic ellipsometer. With the measuring method, a model including a combination of the film thickness, complex refractive index, or the like, of each layer is formed, and fitting is made for the measu |
| 7264701 |
Reference electrode with non-blocking liquid junction |
September 4, 2007 |
| A reference electrode traps silver ions and chloro complex ions leaching to an internal filling solution so that the blocking of the liquid junction can be prevented. A silver/silver chloride electrode can be provided as an internal electrode in an internal filling solution; and a tu |
| 7254212 |
Particulate matter analyzer, collecting filter and system for analyzing and collecting samples f |
August 7, 2007 |
| A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for either simultaneous or |
| 7242473 |
Particle size distribution analyzer |
July 10, 2007 |
| An data processing system 4 includes: an integral part 43 which integrates, by two mutually different times, light intensities indicating light intensity signals outputted from light detectors 24 respectively provided for detecting intensities of scattered light and transmitted light |
| 7242471 |
Glow discharge optical emission spectrometer and glow discharge optical emission spectrometry |
July 10, 2007 |
| The invention provides a glow discharge optical emission spectrometer for intermittently applying a high frequency voltage to a sample and obtaining a measured value from a spectroscope in synchronization with a timing of a unit of application during intermittent application. The obt |
| 7230698 |
Particle size distribution measurement device |
June 12, 2007 |
| In order to supply a dispersion medium to a circulation channel not accompanying any mingling of air and to accomplish the reduction of preparation time and the improvement of the measurement accuracy; a dispersion medium supply system 3 is connected in the vicinity of a drainage out |
| 7227642 |
Absorbance monitor |
June 5, 2007 |
| This invention relates to a multi-component absorbance monitor, and the object is to provide a general-purpose and highly accurate compact absorbance monitor. Disclosed is an absorbance monitor including a light source, a sample cell and a plurality of detectors as elements, wherein a |
| 7209847 |
Measuring apparatus with a validation capability of its previous calibration |
April 24, 2007 |
| An improved measuring apparatus includes a calibration-related data storage section for storing calibration-related data including, at least, user identifiers for identifying users who have calibrated the apparatus, and calibration date and time data indicative of the date and time of |
| 7201071 |
Wide range continuous diluter |
April 10, 2007 |
| A wide range continuous diluter for diluting gases that contain small particles to allow subsequent measurement of the diluted gases with an instrument is provided. A dilution gas inlet receives a dilution gas, and a sample gas inlet receives a sample gas. A flow meter measures the s |
| 7196793 |
Method for analyzing thin-film layer structure using spectroscopic ellipsometer |
March 27, 2007 |
| With extremely-thin-film and thin-film measurement, models are formed based upon a combination of film thickness, optical constants obtained using the dispersion formula, incident angle, etc., and the model and measured spectrums are fit by BLMC for a single layer of a structure with |
| 7180592 |
Particle size distribution analyzer |
February 20, 2007 |
| A particle size distribution analyzer is equipped with cells, a light source, to irradiate particles in a cell and multiple photo-detectors that detect a light intensity of a diffraction light and/or a scattering light generated from the particles. An information processor calculates |
| 7167242 |
Sample analysis method |
January 23, 2007 |
| A sample, in which a dielectric film having a dielectric constant equal to or larger than 50 (based on electrical measurement) is formed on a substrate, is measured by an ellipsometer while a model corresponding to the sample is formed based on effective medium approximation (EMA). A |
| 7159446 |
Particulate matter concentration measuring apparatus |
January 9, 2007 |
| A highly sensitive particulate matter concentration measuring apparatus for measuring a concentration of particulate matter in a sample gas collected in a collecting region formed on a collecting medium, the collecting region being formed by drawing the sample gas through a cross-sec |
| 7151602 |
Particle size distribution analyzer |
December 19, 2006 |
| A dynamic particle size distribution analyzer includes a transparent cell for receiving the sample, a laser light irradiating section and a scattering light detecting section. The transparent cell incorporates a configuration to the walls of the transparent cell to reduce any noise c |
| 7110878 |
Method and apparatus for measuring exhaust gas flow rate and it's application system for analyzi |
September 19, 2006 |
| A differential pressure type emission flow rate measuring method and apparatus and an emission measuring system are capable of correcting measuring error occurring due to pulsation appropriately and enhancing the measuring precision of flow rate. In measuring the flow rate of an emis |
| 7087885 |
Particle size distribution measuring apparatus and method |
August 8, 2006 |
| The present invention provides an apparatus for measuring particle distribution for determining particle size distribution with higher precision by compensating for a reduction in scattering light due to the color of a sample and due to the particle size characterized by Mie scatteri |
| 7084975 |
Particle diameter distribution measurement apparatus and method of calibration |
August 1, 2006 |
| A particle diameter distribution measurement apparatus and method includes a sample cell that can be irradiated by a source of light. A plurality of detectors are positioned operatively adjacent to the sample cell to measure light interacting with a specimen in the sample cell. A storage |
| 7071470 |
Multi-component analyzing apparatus |
July 4, 2006 |
| A multi-component analyzing apparatus in which infrared light is irradiated to a measuring-subject sample S which is constituted by either measuring-subject components whose sorts or quantities are limited or by a mixed article made of said measuring-subject components; intensity of |
| 7042557 |
Sample supplying device for a dry particle-size distribution measuring apparatus and method |
May 9, 2006 |
| A dry particle-size distribution measuring apparatus and method is provided for suspending a plurality of bristle members across a support surface of a dispensing trough with bristles being arranged to contact and disperse any clusters of particles to a primary state prior to releasi |
| 7015963 |
CCD sensor incorporating parallel diffusion regions within the output |
March 21, 2006 |
| In a CCD sensor in which electric charges derived from a plurality of detecting elements 2 are outputted from a signal output portion 9, two diffusion portions 22A and 22B are provided in a parallel manner to each other in the signal output portion 9, and electric charges outputted from |
| 7002684 |
Particle size distribution measuring method, device, and program for compensating for particle c |
February 21, 2006 |
| The present invention provides a particle diameter distribution measuring method, a particle diameter distribution measuring device, and a measuring program which decreases the dependence of the calculation of particle diameter distribution on sample concentration, and can measure wi |
| 6993444 |
Measuring method of component concentration in solution |
January 31, 2006 |
| A measuring method of determining component concentration in a solution by calculating component concentrations in the solution at various temperatures in a small number of steps. The component concentration is measured at an arbitrary temperature T by using a solution absorbance spe |
| 6970243 |
Particle size distribution measuring apparatus |
November 29, 2005 |
| A particle size distribution measuring apparatus which can enhance the precision and the reliability of measurements by eliminating the region of the particle size having inferior measuring precision and resolution is disclosed.In one embodiment, the particle size distribution measuring |
| 6965663 |
X-ray analysis apparatus and method |
November 15, 2005 |
| This invention provides an X-ray analysis apparatus and method capable of simply and accurately determining the position of analysis in a sample from an optical image of it without lowering the sensitivity and/or the spatial resolution in light element analysis. The X-ray analysis appara |
| 6964190 |
Particulate matter concentration measuring apparatus |
November 15, 2005 |
| A highly sensitive particulate matter concentration measuring apparatus for measuring a concentration of particulate matter in a sample gas collected in a collecting region formed on a collecting medium, the collecting region being formed by drawing the sample gas through a cross-section |
| 6961122 |
Measurement chamber with adjustable optical window |
November 1, 2005 |
| A measurement chamber assembly for removing the effects of optical aberrations when a sample is irridated from light through optical windows it is provided. A housing member can support and receive a sample. One or more optical windows for viewing the sample and more particularly for |
| 6943880 |
Spectroscopic ellipsometer with adjustable detection area |
September 13, 2005 |
| A spectroscopic ellipsometer is provided for measuring a small target surface with a high degree of precision. An irradiating optical system provides a polarized light to the surface of the target, while a detecting optical system is provided with a higher F-number for collecting the |
| 6894297 |
Multi-component gas analyzing method using FTIR |
May 17, 2005 |
| The present invention provides a multi-component gas analyzing method using FTIR, which can correct for an influence of a coexistent gas due to an intensity change in the spectrum itself that occurs depending on the base gas composition so that it is possible to carry out, a measurement |
| 6886396 |
Method for easily measuring nitrogen oxide concentration of an engine vehicle emission |
May 3, 2005 |
| The present invention provides a method for easily measuring nitrogen oxide concentration of an engine vehicle emission. The method can measure vehicle emission from an engine of a vehicle in travel with high precision even in regions other than the lean region, that is, regions from the |
