| Patent Number |
Title Of Patent |
Date Issued |
| 7266998 |
Method and apparatus for micromachines, microstructures, nanomachines and nanostructures |
September 11, 2007 |
| Parts and structures are described for micro and nano machines and the creation of macro structures with nano and micro layers of special materials to provide improved performance. |
| 7253407 |
Active cantilever for nanomachining and metrology |
August 7, 2007 |
| A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever having an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the invention, an i |
| 7196328 |
Nanomachining method and apparatus |
March 27, 2007 |
| Methods and apparatus are disclosed for nanomachining operations. Excitation energy settings are provided to minimize machine induced scan cutting. Cut operations can be operated in a feedback mode to provide controlled cutting operations. Measurement and sweep techniques to facilita |
| 7178387 |
Method and apparatus for scanning in scanning probe microscopy and presenting results |
February 20, 2007 |
| Information is collected from a region of interest using a scanning probe microscope having a tip by moving the tip along at least one predefined path extending from a center location to a peripheral location in the region of interest and collecting information using the tip at a plu |
| 7137292 |
Active cantilever for nanomachining and metrology |
November 21, 2006 |
| A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever have an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the invention, the tip an |
| 7109482 |
Object inspection and/or modification system and method |
September 19, 2006 |
| A scanning probe microscope system (100) includes an objective lens (147), a clamping circuit (404), a tip deflection measurement circuit (421), a cantilever (136), and a probe (137) for modifying and inspecting an object (102) disposed on a stage (129). |
| 7091476 |
Scanning probe microscope assembly |
August 15, 2006 |
| A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object. |
| 7045780 |
Scanning probe microscopy inspection and modification system |
May 16, 2006 |
| A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured |
| 7042828 |
Nanometer scale data storage device and associated positioning system |
May 9, 2006 |
| A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprisin |
| 6998689 |
Fluid delivery for scanning probe microscopy |
February 14, 2006 |
| The following invention pertains to the introduction of a gas (or fluid) around a SPM probe or nanotool.TM. to control chemical activity e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging due to the action of |
| 6931710 |
Manufacturing of micro-objects such as miniature diamond tool tips |
August 23, 2005 |
| Techniques for affixing a micro-object to a mounting structure at a desired relative orientation. A shaped portion of a workpiece is caused to become embedded in a reference structure at a first relative orientation. The workpiece is parted into first and second portions, the first porti |
| 6923044 |
Active cantilever for nanomachining and metrology |
August 2, 2005 |
| A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever have an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the invention, the tip an |
| 6880388 |
Active cantilever for nanomachining and metrology |
April 19, 2005 |
| A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever having an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the invention, an i |
| 6865927 |
Sharpness testing of micro-objects such as miniature diamond tool tips |
March 15, 2005 |
| A micro-object having a desired sharp point or edge may be optically tested during fabrication. This is accomplished by applying a known force to the workpiece against an optically opaque layer disposed on a transparent substrate, passing light down the workpiece toward the opaque layer, |
| 6861648 |
Scanning probe microscopy inspection and modification system |
March 1, 2005 |
| A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured |
| 6813937 |
Method and apparatus for micromachines, microstructures, nanomachines and nanostructures |
November 9, 2004 |
| Parts and structures are described for micro and nano machines and the creation of macro structures with nano and micro layers of special materials to provide improved performance. |
| 6802646 |
Low-friction moving interfaces in micromachines and nanomachines |
October 12, 2004 |
| A low-friction device having a moving interface comprising first and second members. Each of the members has a maximum dimension of about 100 .mu.m or less between any two points. At least the first member is formed of diamond and the first and second members are in sliding contact or me |
| 6787768 |
Method and apparatus for tool and tip design for nanomachining and measurement |
September 7, 2004 |
| A single-body structure is presented for use as a tool tip for making modifications and/or collecting measurements on a target object. The single-body structure comprises a first end portion, a second end portion opposite the first portion, and a mid portion between the first and second |
| 6752008 |
Method and apparatus for scanning in scanning probe microscopy and presenting results |
June 22, 2004 |
| Information is collected from a region of interest using a scanning probe microscope having a tip by moving the tip along at least one predefined path extending from a center location to a peripheral location in the region of interest and collecting information using the tip at a plurali |
| 6724712 |
Nanometer scale data storage device and associated positioning system |
April 20, 2004 |
| A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprising |
| 6515277 |
Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-fiel |
February 4, 2003 |
| A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements. |
| 6507553 |
Nanometer scale data storage device and associated positioning system |
January 14, 2003 |
| A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprising |
| 6396054 |
Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-fiel |
May 28, 2002 |
| A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements. |
| 6369379 |
Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-fiel |
April 9, 2002 |
| A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements. |
| 6339217 |
Scanning probe microscope assembly and method for making spectrophotometric, near-field, and sca |
January 15, 2002 |
| A scanning probe microscope assembly (100) that has an atomic force measurement (AFM) mode (137), a scanning tunneling measurement (STM) mode (138), a near-field spectrophotometry mode (143), a near-field optical mode (151), and a hardness testing mode 195 for examining an object. |
| 6281491 |
Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-fiel |
August 28, 2001 |
| A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements. |
| 6265711 |
Scanning probe microscope assembly and method for making spectrophotometric near-field optical a |
July 24, 2001 |
| A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object. |
| 6252226 |
Nanometer scale data storage device and associated positioning system |
June 26, 2001 |
| A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium (202) of the data storage device (200) with respect to each other in first and second predefined directions. The positioning system (100) comprises a positioning appar |
| 6242734 |
Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-fiel |
June 5, 2001 |
| A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements. |
| 6232597 |
Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-fiel |
May 15, 2001 |
| A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements. |
| 6144028 |
Scanning probe microscope assembly and method for making confocal, spectrophotometric, Near-Fiel |
November 7, 2000 |
| A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements. |
| 5756997 |
Scanning probe/optical microscope with modular objective/probe and drive/detector units |
May 26, 1998 |
| A scanning probe and optical microscope for inspecting an object the comprises a microscope stand to support the object, a modular objective/probe unit, a modular drive/detector unit, and an optical observation head. The modular objective/probe unit is removably attached to the micro |
| 5751683 |
Nanometer scale data storage device and associated positioning system |
May 12, 1998 |
| A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprising |
