A method and apparatus are provided for measuring energy dissipation during oscillatory operation of an atomic force microscope (AFM). Interaction between the AFM's probe and another medium of interest dissipates energy. This dissipation is reflected by an effect on one or more parameter
The oscillation parameters of a probe of an atomic force microscope (AFM) typically vary over time. This variation can cause problems during either 1) scanning or measurement functions in which the probe's operative state is one in which oscillatory measurements are taken or 2) the proce
The mechanical properties of a surface are measured by using a pointed tip on the end of a bendable cantilever such that with force on the other end of the cantilever the tip can be pushed into the surface using the bending of the cantilever as the measure of the constant force. The inde
A stiffener assembly which provides for improved performance of a movable stage arrangement. Often, it is desired to provide a movable stage arrangement in which a stage moves linearly with respect to a stationary base. In many applications, it is necessary for the stage to move to s
