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Delta Design, Inc. Patents
Assignee:
Delta Design, Inc.
Address:
Poway, CA
No. of patents:
45
Patents:












Patent Number Title Of Patent Date Issued
8272673 Pick and place handler with a floating lock device September 25, 2012
A semiconductor handler subassembly is provided. The semiconductor handler subassembly includes an adjustment apparatus with a floating lock that is configured to adjust and lock in place to a desired position, and a tip attached to the floating lock and configured to engage a part.
8106349 Vision alignment with multiple cameras and common coordinate at contactor for IC device testing January 31, 2012
A method and apparatus for aligning a device with a contactor is provided. The apparatus includes a pick and place device, for transporting the device. A first camera acquires an image of the device relative to device holder fiducials of the pick and place device. A second camera det
8041533 IC device-in-pocket detection with angular mounted lasers and a camera October 18, 2011
A detection method and apparatus is provided. The detection apparatus includes at least two angular mounted lasers, a surface for receiving laser lines emitted by the angular mounted lasers, a camera for detecting a laser pattern formed by the laser lines on the surface, and a processor
8040145 Miniature fluid-cooled heat sink with integral heater October 18, 2011
A temperature control device that includes a miniature liquid-cooled heat sink with integral heater and sensing elements is used as part of a system to provide a controlled temperature surface to an electronic device, such as a semiconductor device, during the testing phase. The temp
7986155 Method of manufacturing a heat sink pedestal device with interface medium chamber July 26, 2011
A heat sink pedestal device allows for the use of generic thermal units such as heat sinks. An interposer configured to fit a specific device under test is mounted to a retainer. The retainer firmly holds the interposer in position. In addition, the retainer may be mounted to a therm
7842912 Camera based vision alignment with device group guiding for semiconductor device testing handler November 30, 2010
A vision alignment system and method is provided. The vision alignment system includes one or more grouped alignment plates with guiding inserts configured to receive multiple devices, and groups of three actuators, configured to actuate the alignment plates to correct the position o
7755376 Camera based pin grid array (PGA) inspection system with pin base mask and low angle lighting July 13, 2010
An inspection system, for inspecting pin grid arrays on integrated circuit devices includes a pin base mask configured to receive a device having a pin grid array. A dark-field, low-angle lighting system emits light onto the pin grid array. The pin base mask and low-angle lighting system
7700891 Process for handling semiconductor devices and transport media in automated sorting equipment April 20, 2010
A method for sorting devices in automated handling equipment, including placing a plurality of input trays containing a plurality of devices and a plurality of empty trays into a handler; sorting the plurality of devices in the plurality of input trays into the plurality of empty trays
7639029 Heat sink pedestal with interface medium chamber December 29, 2009
A heat sink pedestal device allows for the use of generic thermal units such as heat sinks. An interposer configured to fit a specific device under test is mounted to a retainer. The retainer firmly holds the interposer in position. In addition, the retainer may be mounted to a therm
7626407 Miniature fluid-cooled heat sink with integral heater December 1, 2009
A temperature control device that includes a miniature liquid-cooled heat sink with integral heater and sensing elements is used as part of a system to provide a controlled temperature surface to an electronic device, such as a semiconductor device, during the testing phase. The temp
7605581 Apparatus and method for controlling die force in a semiconductor device testing assembly October 20, 2009
A semiconductor device test assembly includes a heat sink having a surface configured to support a device under test, an inner bellow, an outer bellow at least partially surrounding the inner bellow, and a fluid channel within the inner bellow for providing a fluid to the heat sink.
7589520 Soak profiling September 15, 2009
A method for soaking a device in an automated testing system, includes setting a temperature control device to a first temperature, exposing the device to the temperature control device, and driving the temperature control device to a second temperature. The temperature transition rate
7506451 Camera based two-point vision alignment for semiconductor device testing handlers March 24, 2009
A guiding plate based vision alignment system for a test handler includes cameras, configured to view the position difference between a tested device and the corresponding contactor. A pick-and-place handler is configured to move the device. A guiding plate is configured to actuate g
7373967 Mechanical assembly, for regulating the temperature of an IC-Chip, having a gimbaled heat-exchan May 20, 2008
A mechanical assembly for regulating the temperature of an IC-chip in an IC-module includes: a) a heat-exchanger having a first face for contacting a second face on the IC-module; and b) a gimbal, coupled to the heat-exchanger, for tilting and pressing the first face flatly against t
7355428 Active thermal control system with miniature liquid-cooled temperature control device for electr April 8, 2008
A temperature control system, which includes a miniature liquid-cooled heat sink, is used to provide a controlled temperature surface to an electronic device, such as a semiconductor device, during the testing or burn-in phase. In one embodiment, the system includes a miniature liqui
7355386 Method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable ta April 8, 2008
A method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester uses a set of laser distance sensors to align the vacuum nozzles with the target. Alignment occurs when certain combinations of distance and distance changes are se
7336197 LED lighting system for line scan camera based multiple data matrix scanners February 26, 2008
A LED lighting system for reading multiple data matrix codes on device populated transport media with a line scan camera, includes a light housing, a plurality of LED circuit bars, having a plurality of LEDs, mounted to an inner surface of the light housing arranged to provide high a
7310230 Temperature control system which sprays liquid coolant droplets against an IC-module at a sub-at December 18, 2007
A system for maintaining an IC-chip near a set-point temperature while electrical power dissipation in the IC-chip is varied includes a container having an open end with a seal ring. Located in the container is at least one nozzle for spraying liquid coolant droplets on a portion of
7243704 Mechanical assembly for regulating the temperature of an electronic device, having a spring with July 17, 2007
A mechanical assembly, for regulating the temperature of an electronic device, includes a gimbal and a heat-exchanger which is attached to the gimbal. The gimbal includes a base member, a carrier member, and a spring which has--1) a first end with a rigid coupling to one of the base and
7224586 Method of maintaining an IC-module near a set-point May 29, 2007
A system for maintaining an IC-chip near a set-point temperature while electrical power dissipation in the IC-chip is varied includes a container having an open end with a seal ring. Located in the container is at least one nozzle for spraying liquid coolant droplets on a portion of
7199597 Dual feedback control system for maintaining the temperature of an IC-chip near a set-point April 3, 2007
A dual feedback control system maintains the temperature of an IC-chip near a set-point while the IC-chip dissipates a varying amount of electrical power. The first feedback circuit sends electrical power to an electric heater with a variable magnitude that compensates for changes in
7100389 Apparatus and method having mechanical isolation arrangement for controlling the temperature of September 5, 2006
An apparatus and method for controlling the temperature of an electronic device under test utilizes a thermal head spaced apart from a movable support structure by a mechanical isolation assembly. The support structure has a manifold configured to route refrigerant fluid between the
7062934 Apparatus and method for controlling the temperature of an electronic device June 20, 2006
An apparatus for controlling the temperature of an electronic device. The apparatus comprises a refrigeration system including a compressor and a multi-pass heat exchanger. The refrigeration system is operative to circulate a refrigerant fluid through a fluid flow loop such that the
7017358 Apparatus and method for controlling the temperature of an electronic device March 28, 2006
An apparatus for controlling the temperature of an electronic device under test includes a thermal head. The thermal head defines a flow channel for passage of a refrigerant fluid so as to cause transfer of thermal energy between the electronic device and the thermal head. A refrigeratio
6993922 Apparatus and method for controlling the temperature of an electronic device under test February 7, 2006
An apparatus for controlling the temperature of an electronic device under test includes a thermal head having a temperature controlled surface for making thermal contact with the electronic device. The thermal head defines a flow channel for passage of a refrigerant fluid so as to cause
6985000 Thermal control of a DUT using a thermal control substrate January 10, 2006
A solid state thermal control device contains a substrate and a plurality of solid state thermal elements on the substrate. The thermal elements are adapted to provide thermal control to a device under test (DUT). Each solid state thermal element contains at least one solid state heater
6975028 Thermal apparatus for engaging electronic device December 13, 2005
An apparatus for controlling the temperature of an electronic device utilizes a thermal head attached to a base structure including an integral isolation arrangement. For example, the isolation arrangement can be formed as a planar spring defined by slots in the base structure. The base
6886976 Method for controlling the temperature of an electronic component under test May 3, 2005
A combined heater and heat sink assembly regulates the temperature of a device under test. The combined heating/cooling assembly includes a heater assembly inlay that is received within a heat sink. The heater assembly includes a heating surface that is coplanar with a cooling surface of
6864678 Nestless plunge mechanism for semiconductor testing March 8, 2005
A plunge mechanism includes an elongated, hollow probe that vacuum grips at its free end, and carries, without relative movement therebetween, an electronic device under test (DUT) to a test site on a board, or socket, of a test circuit. A reciprocating drive plunges the DUT in a first
6862405 Apparatus, method and system of liquid-based, wide range, fast response temperature control of e March 1, 2005
An active temperature control system for a DUT utilizes a heat sink containing HFE7100 liquid and an electric heater. The liquid is cooled below the set point and the heater is used to bring the DUT up to the set point. Set points in the range of -10 degrees C. to +110 degrees C. can be
6825681 Thermal control of a DUT using a thermal control substrate November 30, 2004
A solid state thermal control device contains a substrate and a plurality of solid state thermal elements on the substrate. The thermal elements are adapted to provide thermal control to a device under test (DUT). Each solid state thermal element contains at least one solid state heater
6788084 Temperature control of electronic devices using power following feedback September 7, 2004
A system and method for controlling a temperature of a device during testing with a thermal controller and a heat exchanger includes measuring an instantaneous power consumption of the device during testing. The heat exchanger is controlled with the thermal controller using the measured
6650132 Method and apparatus for temperature control of a device during testing November 18, 2003
A method for controlling the temperature of a DUT during a testing operation, includes a) measuring a parameter related to power consumption by the DUT during testing, such as current consumption; and b) using the parameter related to power consumption to operate a temperature control
6636062 Temperature control device for an electronic component October 21, 2003
A combined heater and heat sink assembly regulates the temperature of a device under test. The combined heating/cooling assembly includes a heater assembly inlay that is received within a heat sink. The heater assembly includes a heating surface that is coplanar with a cooling surface of
6549026 Apparatus and method for temperature control of IC device during test April 15, 2003
An apparatus for controlling the temperature, during testing, of IC devices formed on a wafer includes a chuck for locating the devices during testing and multiple temperature control devices arranged on the chuck to correspond with the arrangement of the devices being tested on the wafe
6518782 Active power monitoring using externally located current sensors February 11, 2003
The power of a device under test (DUT) is monitored without reliance on dedicated current and voltage monitoring signals available from a semiconductor test unit. One or more magneto-resistive current sensors are provided external to, and in between the DUT and a power source. The cu
6498899 Apparatus, method and system of liquid-based, wide range, fast response temperature control of e December 24, 2002
A method of controlling a temperature of a semiconductor device during testing is used with a system including a heater and a heat sink and a temperature control system. The semiconductor device is thermally coupled to the heater, which is thermally coupled to a heat sink. The heat sink
6489793 Temperature control of electronic devices using power following feedback December 3, 2002
A method for controlling a device temperature measures a parameter related to device power consumption and utilizes the parameter to control the device temperature. This can be achieved with a system including a heat exchanger, a power monitor, and a circuit which controls the temperatur
6476627 Method and apparatus for temperature control of a device during testing November 5, 2002
A method for controlling the temperature of a DUT during a testing operation, includes a) measuring a parameter related to power consumption by the DUT during testing, such as current consumption; and b) using the parameter related to power consumption to operate a temperature control
6468023 Apparatus and method for inverting an IC device October 22, 2002
An IC handler inverts an IC in a single motion by first gripping the IC with two fingers attached to an arm and then flipping the IC over by rotating the arm in a one-hundred eighty degree arc. The fingers maintain contact with the IC during the entire one-hundred eighty degree motion.
6389225 Apparatus, method and system of liquid-based, wide range, fast response temperature control of e May 14, 2002
An active temperature control system for a DUT utilizes a heat sink containing HFE7100 liquid and an electric heater. The liquid is cooled below the set point and the heater is used to bring the DUT up to the set point. Set points in the range of -10 degrees C. to +110 degrees C. can be
6227373 Electronic device handling system and method May 8, 2001
An apparatus for handling electronic devices in a system that assigns a category corresponding to one of a plurality of predetermined categories to the electronic devices and sorts the electronic devices according to the categories is provided. A plurality of platforms, each for supporti
5594355 Electrical contactor apparatus for testing integrated circuit devices January 14, 1997
A contactor apparatus for electrically interconnecting a lead of an electrical device to a conductive area on a board. The contactor apparatus includes a housing having a slot. It also includes a probe disposed within the slot, the probe having a fulcrum for engaging the conductive area
5330043 Transfer apparatus and method for testing facility July 19, 1994
An apparatus and method for picking up parts from a conveyor belt, moving them to a test rig for testing, and returning tested parts to the belt, in which a rotatable shaft is rotated back and forth between first and second positions. The shaft carries first and second pick-up heads at i
4314628 Feed and storage track for DIP devices February 9, 1982
A feed and storage track which will hold DIP devices of three different widths in aligned rows, such as during treatment in an environmental chamber, and which will facilitate precise individual feed of the devices to a handling or testing station. The track has three rails with spacings

 
 
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