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Advantest Corporation Patents
Assignee:
Advantest Corporation
Address:
Tokyo, JP
No. of patents:
1246
Patents:












Patent Number Title Of Patent Date Issued
RE37961 Pin connector, pin connector holder and packaging board for mounting electronic component January 7, 2003
A pin connector has an outer contact bent outwardly from at least a portion of a side wall of a metallic slender sleeve and an inner contact bent inwardly from at least a portion of a side wall of the metallic slender sleeve. The outer contact and the inner contact are resilient radially
RE32845 Period and frequency measuring instrument January 24, 1989
A device for determining with high accuracy the period and frequency of an input signal by taking into account the fractions of a clock signal that are normally ignored. A gate signal with an integral number of clock pulses is generated. Each fractional time is accurately measured by fir
D597951 Electrical connector housing August 11, 2009
D584693 Electrical connector January 13, 2009
D583769 Electrical connector December 30, 2008
D581876 Electrical connector December 2, 2008
D442568 IC module insert May 22, 2001
D432504 Contactor for semiconductor IC testers October 24, 2000
D431580 IC tray holder October 3, 2000
D426522 Contactor for semiconductor IC testers June 13, 2000
D420927 IC test-head stand February 22, 2000
D377319 Network analyzer January 14, 1997
8581571 Measuring apparatus, testing apparatus and measuring method November 12, 2013
Provided is a measurement apparatus that measures a characteristic of a filter, comprising a first transmission line that has the filter connected therein, the first transmission line receiving a multi-tone signal having signal components at a plurality of frequencies from an input e
8575961 Multi-valued driver circuit November 5, 2013
A multi-valued driver circuit selectively outputs, to a transmission line, one from among multiple voltages according to a selection signal. A memory circuit stores setting data which define the respective levels of the multiple voltages. According to the selection signal, a selector
8572145 Signal processing apparatus, digital filter and recording medium October 29, 2013
Provided is a signal processing apparatus for compensating for a non-linear distortion of a digital signal, including: an analysis signal generating section that converts the digital signal into a analysis signal of a complex number, using a digital filter; and a compensation section
8565559 Optical device and optical modulation apparatus October 22, 2013
To achieve high-speed optical modulation using a crystal having a complicated refractive index characteristic with respect to applied electric field, provided is an optical device comprising a substrate; a dielectric film that is formed on the substrate and includes a first optical w
8301411 Electronic device, host apparatus, communication system, and recording medium October 30, 2012
Provided is a communication system comprising a host apparatus and an electronic device that is implemented in an apparatus that communicates with the host apparatus via a network. The electronic device includes an operation circuit that operates when the electronic device is impleme
8299935 Test apparatus and test method October 30, 2012
A test apparatus comprising a plurality of test units that test a device under test; a plurality of housing sections that respectively house the test units therein; a plurality of opening/closing sections that are disposed respectively in the housing sections and that expose the test
8299810 Test apparatus and electronic device October 30, 2012
Provided is a test apparatus that tests a device under test including an external interface circuit that transfers signals between an internal circuit inside a device and the outside of the device, the test apparatus comprising a pattern generating section that inputs, to the external
8294759 Calibration method of electronic device test apparatus October 23, 2012
In an electronic device test apparatus using image processing technology to position an IC device relative to a socket, a calibration method of an electronic device test apparatus of calibrating a relative position of a device camera with respect to a socket, the method comprising: c
8294121 Fixing instrument October 23, 2012
Fixtures according to the present invention include fixing surfaces in the same shape as end surfaces of a device under test which is to be measured while an electromagnetic wave to be measured at a frequency equal to more than 0.01 [THz] and equal to or less than 100 [THz] is irradi
8290032 Distortion identification apparatus, test system, recording medium and distortion identification October 16, 2012
Provided is a signal output control section that inputs to a digitizer a reference signal whose frequency changes at each prescribed measurement cycle; a data extracting section that extracts a number of pieces of data corresponding to an integer multiple of a period of the reference sig
8289040 Test wafer unit and test system October 16, 2012
A wafer unit for testing is electrically connected to a plurality of chips to be tested formed on a wafer to be tested, the wafer unit for testing including: a connecting wafer provided to face the wafer to be tested, and to be electrically connected to each of the plurality of chips
8286045 Test apparatus and test method October 9, 2012
A test apparatus testing a device under test includes a main pattern generating section that generates a main pattern, a plurality of sub-pattern generating sections each of which generates a sub-pattern corresponding to a different one of segment cycles based on a main pattern, the
8280667 Test apparatus, performance board and calibration board October 2, 2012
Provided is a test apparatus that tests a device under test, comprising a waveform generator that generates a test signal to be supplied to the device under test; a digitizer that measures a response signal output by the device under test; a judging section that judges acceptability of t
8280529 Sequence control apparatus and test apparatus October 2, 2012
There is provided a sequence control apparatus for outputting a sequence of control signals to operate a control target, including a sequence storing section that stores thereon sequence data in association with each state received from outside, where the sequence data includes a plu
8279438 Optical measuring apparatus October 2, 2012
An object is to enable a change in a frequency for which an electric signal based on an optical signal is measured by a spectrum analyzer. An optical measurement device includes a first photoconductive switch that receives predetermined pulse light from a first laser light source, and
8279379 Light receiving device, light receiving device manufacturing method, and light receiving method October 2, 2012
There is provided a light receiving device including a polarization dispersing section that disperses a polarization direction of incoming light into a plurality of polarization directions, a light collecting section that has a metal pattern shaped like concentric circles on a surfac
8278962 Transfer circuit, transmitter, receiver and test apparatus October 2, 2012
There is provided a transfer circuit including a transmitter that outputs a transmission signal and a receiver that receives the transmission signal. Here, the receiver supplies to the transmitter a feedback signal for controlling a common level of the transmission signal output from the
8278961 Test apparatus and test method October 2, 2012
Provided is a test apparatus for testing a device under test, including: a level comparing section that receives a signal under test output from the device under test and outputs a logical value, the logical value indicating a comparison result obtained by comparing a signal level of
8278957 Circuit board unit and testing apparatus October 2, 2012
Provided is a circuit board unit for connecting a connecting terminal of a testing apparatus to a connected terminal of a device under test, including: a circuit board having, on one surface, a contact corresponding to the connected terminal; and a connector guide provided on the one
8275569 Test apparatus and diagnosis method September 25, 2012
Provided is a test apparatus that tests a device under test, comprising: a plurality of modules that each include an output circuit that outputs a prescribed output signal to the device under test and a measurement circuit that measures a prescribed characteristic of the device under
8274296 Test apparatus and electronic device that tests a device under test September 25, 2012
Provided is a test apparatus that tests a device under test, comprising a digital signal generator that outputs in parallel one or more n-bit digital test signals, where n is an integer greater than or equal to 1; a plurality of driver circuits that are connected respectively to a pl
8271222 Sampling apparatus and sampling method September 18, 2012
Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage
8271219 Deterministic component model identifying apparatus, identifying method, program, recording medi September 18, 2012
There is provided a deterministic component model identifying apparatus for determining a type of a deterministic component contained in a probability density function supplied thereto. The deterministic component model identifying apparatus includes a spectrum calculating section th
8270225 Data receiving circuit September 18, 2012
A variable delay circuit provides an adjustable delay to a strobe signal. An input latch circuit latches each bit data included in internal serial data by a strobe signal delayed by the variable delay circuit. A delay set unit adjusts a delay amount provided to the strobe signal by the
8269569 Test apparatus for digital modulated signal September 18, 2012
A test apparatus includes digital modulators provided in increments of multiple channels. A baseband signal generator performs retiming of data input as a modulation signal for the in-phase (quadrature) component, using a timing signal the timing of which can be adjusted, thereby gen
8269553 Delay circuit September 18, 2012
A delay circuit includes a MOSFET and bias voltage sources. The bias voltage sources apply a voltage difference between the drain and source of the MOSFET. The bias voltage source supplies a source voltage to a source electrode of the MOSFET. The bias voltage source supplies a drain
8261139 Clear instruction information to indicate whether memory test failure information is valid September 4, 2012
A test apparatus includes a fail memory (AFM) for storing therein fail information in association with each of the addresses of a memory under test and a mark memory (CMM) for storing therein, in association with each of the addresses of the memory under test, validity information in
8261119 Test apparatus for testing device has synchronization module which synchronizes analog test modu September 4, 2012
There is provided a test apparatus for testing a device under test, including a plurality of test modules that test the device under test, and a synchronization module that is connected to each of the plurality of test modules, where the synchronization module synchronizes together t
8258803 Test apparatus and test method September 4, 2012
Provided is a test apparatus and a test method related to the test apparatus for testing a device under test, including: a plurality of test modules that exchange a signal with the device under test; a test control section that outputs a group read instruction for collectively reading
8258802 Test apparatus and test method September 4, 2012
Provided is a test apparatus for testing a device under test, including: a plurality of test modules that exchange signals with the device under test; a bus to which the plurality of test modules are connected; and a test control section that controls the plurality of test modules via th
8255198 Method and structure to develop a test program for semiconductor integrated circuits August 28, 2012
Test program development for a semiconductor test system, such as automated test equipment (ATE), using object-oriented constructs is described. The invention provides a method for describing test system resources, test system configuration, module configuration, test sequence, test
8254435 Modulation method and modulator using pulse edge shift August 28, 2012
A variable delay circuit delays a carrier signal having a predetermined frequency, and outputs a modulated signal. A delay setting unit sets a delay period for the variable delay circuit according to a data signal to be modulated. The delay setting unit assigns each symbol in the data
8253474 Leakage compensated electronic switch August 28, 2012
An electronic circuit for switching purposes comprises a set of at least four electronic switches. A first subset and a second subset comprise at least two electronic switches of said set, respectively. Said at least two electronic switches of said first subset are arranged in a serial
8253428 Probe apparatus and test apparatus August 28, 2012
A probe apparatus exchanging signals with a target device, includes: a contact section electrically connected to the target device by contacting a terminal of the target device; a non-contact section that exchanges signals with the target device in a state not contacting the terminal of
8253103 Terahertz wave measuring apparatus having space arrangement structure and measuring method August 28, 2012
There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electrom
8248281 High speed, high resolution, high precision voltage source/AWG system for ATE August 21, 2012
A method for compensating a linearity error of a dual digital-to-analog converter, including the steps of receiving a digital data signal which include a plurality of bits, the digital data signal indicating a voltage signal to be generated, the plurality of bits representing a set of
8247925 Power source stabilization circuit, electronic device and testing apparatus August 21, 2012
A power source stabilization circuit provided within a chip of an electronic device is provided. The power source stabilization circuit stabilizes a power source voltage supplied to an operational circuit of the electronic device. The power source stabilization circuit includes an am
8243838 Test apparatus and program August 14, 2012
Provided is a measurement apparatus that measures power of an orthogonal frequency division multiplexing modulated signal (OFDM modulated signal) output from a transmitting device, comprising an output control section that causes the transmitting device to output the OFDM modulated signa

 
 
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