| Patent Number |
Title Of Patent |
Date Issued |
| RE37961 |
Pin connector, pin connector holder and packaging board for mounting electronic component |
January 7, 2003 |
| A pin connector has an outer contact bent outwardly from at least a portion of a side wall of a metallic slender sleeve and an inner contact bent inwardly from at least a portion of a side wall of the metallic slender sleeve. The outer contact and the inner contact are resilient radially |
| RE32845 |
Period and frequency measuring instrument |
January 24, 1989 |
| A device for determining with high accuracy the period and frequency of an input signal by taking into account the fractions of a clock signal that are normally ignored. A gate signal with an integral number of clock pulses is generated. Each fractional time is accurately measured by fir |
| D597951 |
Electrical connector housing |
August 11, 2009 |
|
| D584693 |
Electrical connector |
January 13, 2009 |
|
| D583769 |
Electrical connector |
December 30, 2008 |
|
| D581876 |
Electrical connector |
December 2, 2008 |
|
| D442568 |
IC module insert |
May 22, 2001 |
|
| D432504 |
Contactor for semiconductor IC testers |
October 24, 2000 |
|
| D431580 |
IC tray holder |
October 3, 2000 |
|
| D426522 |
Contactor for semiconductor IC testers |
June 13, 2000 |
|
| D420927 |
IC test-head stand |
February 22, 2000 |
|
| D377319 |
Network analyzer |
January 14, 1997 |
|
| 7620858 |
Fabric-based high speed serial crossbar switch for ATE |
November 17, 2009 |
| A loopback module is disclosed in which N differential High Speed Serial (HSS) digital data input channels are received and sent to a serial to parallel converter, whose output is M-bit wide parallel data. By doing so, the effective data rate is divided down by M to 1/M "fabric" speeds. |
| 7619427 |
Temperature control device and temperature control method |
November 17, 2009 |
| Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic devic |
| 7619426 |
Performance board and cover member |
November 17, 2009 |
| A performance board which is attached to a semiconductor test apparatus and on which devices under test are mounted is provided. The performance board includes: a substrate; sockets which are attached to the surface of the substrate and on which devices under test are mounted; and an |
| 7616007 |
Device, method, program, and recording medium for error factor measurement, and output correctio |
November 10, 2009 |
| There is provided an error factor measurement device for measuring an error factor in a switch branch signal source including a signal source and a switch, and the error factor measurement device includes a reference error factor component recording unit which records respective comp |
| 7613960 |
Semiconductor device test apparatus and method |
November 3, 2009 |
| There is provided a semiconductor test apparatus which uses a test processor to apply a test signal to a DUT having a semiconductor device within it to determine whether the memory is acceptable or not on the basis of a response signal, and uses a repair analysis computing unit to an |
| 7612698 |
Test apparatus, manufacturing method, and test method |
November 3, 2009 |
| There is provided a test apparatus for testing a device under test, the test apparatus including: a test signal supplying section that supplies a digital input signal for testing purposes, to the device under test; a reference signal output section that outputs an analogue reference sign |
| 7612590 |
Oscillating apparatus |
November 3, 2009 |
| An oscillating apparatus is provided that includes: an integration circuit that outputs a control signal based on an integration value of two inputted voltage values; an oscillator that outputs an oscillation signal of a frequency that is based on the control signal; a phase comparator |
| 7612575 |
Electronic device test apparatus for successively testing electronic devices |
November 3, 2009 |
| An apparatus having a plurality of test units (520), a loading transport unit (510) transporting a plurality of electronic devices from a customer tray (4C) to a test tray (4T) before being loaded in a test unit, and a classifying transport unit (530) transporting a plurality of electron |
| 7611377 |
Interface apparatus for electronic device test apparatus |
November 3, 2009 |
| An interface apparatus 5 mounted on a test head 4 comprises: an electrical cable 54 having one end electrically connected to a socket board 66; a device side connector 541 attached to the other end of the electrical cable 54; and a intermediate connector 53 electrically connecting a test |
| 7610538 |
Test apparatus and performance board for diagnosis |
October 27, 2009 |
| A test apparatus being capable of replacing a test module with the other kind of test module that tests device under tests by using the test module is provided. The test apparatus includes a plurality of test modules that transmit/receive signals to/from the device under tests to tes |
| 7609437 |
Optical amplifier apparatus |
October 27, 2009 |
| An optical amplifier apparatus capable of dealing with different wavelength bands and capable of outputting an amplified light with reduced noise for any one of the wavelength bands. In a case of amplifying a light of C-band, terminals (51,52) of an optical switch (50) are connected |
| 7609184 |
D-A convert apparatus and A-D convert apparatus |
October 27, 2009 |
| Provided is a D-A conversion apparatus that outputs an analog output voltage according to digital input data, which includes a capacitance array main D-A converter that supplies a main voltage according to the input data to an output terminal of the D-A conversion apparatus, a correc |
| 7609183 |
Analog to digital converter and recording medium |
October 27, 2009 |
| An analog-to-digital conversion apparatus includes an interleaving section that aligns the digital data respectively output from a plurality of analog-to-digital conversion sections and generates a data sequence, and a correction arithmetic section that corrects a data value error caused |
| 7609052 |
Contact pusher, contact arm, and electronic device handling apparatus |
October 27, 2009 |
| A contact pusher attached to the front end of a contact arm bringing an IC device into contact with a contact part of a test head and pushing the IC device is provided with a suction pad for picking up and holding an IC device, a first press part for pushing against a package of an IC de |
| 7606849 |
Method and apparatus for improving the frequency resolution of a direct digital synthesizer |
October 20, 2009 |
| The present invention is directed to the use of a DDS to generate a high purity reference signal with high frequency resolution by switching a frequency tuning word (FTW) between particular values for particular time durations to produce two or more closely spaced frequencies that appear |
| 7605738 |
A-D converter and A-D convert method |
October 20, 2009 |
| There is provided an A/D converter that outputs a digital output signal obtained by digitalizing an analog input signal. The A/D converter includes a bit selecting section that selects a conversion object bit from a high-order bit to a low-order bit of the digital output signal in or |
| 7605621 |
Oscillating apparatus |
October 20, 2009 |
| An oscillating apparatus is provided that includes: a filter circuit that includes a capacitor and outputs a control signal based on an amount of charge accumulated in the capacitor; an oscillator that outputs an oscillation signal of a frequency that is based on the control signal; a |
| 7605584 |
Voltage generating apparatus, current generating apparatus, and test apparatus |
October 20, 2009 |
| There is provided a voltage generating apparatus that outputs a power source voltage from a voltage outputting terminal. The apparatus includes a voltage outputting section that outputs the power source voltage according to a current or voltage to be input, a first differential ampli |
| 7603604 |
Test apparatus and electronic device |
October 13, 2009 |
| A test apparatus that tests a device under test is provided. The test apparatus includes: a pattern memory that stores in a compression format a test instruction sequence to define a test sequence for testing the device under test; an expanding section mat expands in a non-compression |
| 7603241 |
Light receiving apparatus, testing apparatus, light receiving method, testing method, test modul |
October 13, 2009 |
| An optical receiving apparatus that receives an optical signal and outputs a data value of digital data transmitted by the optical signal is provided, including a light receiving element that receives the optical signal and outputs a photocurrent according to a strength of the optical |
| 7602546 |
Laser oscillator |
October 13, 2009 |
| To extend the temperature range for a stable operation without mode hopping and obtain a stable laser oscillation, a laser oscillator is provided. The laser oscillator includes: an optical circulator in which light incident on a first port is exited from the second port, light incide |
| 7602252 |
Sigma delta modulator, fractional frequency synthesizer and sigma delta modulating method |
October 13, 2009 |
| There is provided a sigma delta modulator that outputs an output signal obtained by performing sigma delta modulation on an input signal, including: a plurality of accumulators that are serially connected; and an output signal generating section that generates the output signal on th |
| 7596730 |
Test method, test system and assist board |
September 29, 2009 |
| A test method for testing a device under test by using an event tester is provided. The test method includes: receiving a test signal generated by the event tester and applied to the device under test and sequentially writing the same to a memory; reading sequentially the written test |
| 7596173 |
Test apparatus, clock generator and electronic device |
September 29, 2009 |
| There is provided a clock generator for generating a single-phase clock into which jitter has been injected, having a multi-phase clock generating section for generating a plurality of clock signals having an almost equal phase difference from each other and a jitter injecting sectio |
| 7589549 |
Driver circuit and test apparatus |
September 15, 2009 |
| Provided is a driver circuit that includes a first operational mode and a second operational mode and outputs an output signal according to an input signal, including a first driver section that, in the first operational mode, generates and outputs the output signal according to the |
| 7583218 |
Comparator and A-D converter |
September 1, 2009 |
| A comparator is provided that outputs a comparison result obtained by comparing two signals. The comparator includes a positive buffer that converts a positive comparison signal, which has a level according to a difference between the two signals, into a positive logic signal that in |
| 7576571 |
Potential comparator and test apparatus |
August 18, 2009 |
| The potential comparator includes input wires 3 and 4 that input a differential signal output from a test object 2, a high-threshold side divided-voltage generating section 5 that acquires the differential signal from each of the input wires 3 and 4 and generates and outputs the firs |
| 7576555 |
Current measuring apparatus, test apparatus, current measuring method and test method |
August 18, 2009 |
| There is provided a current measuring apparatus that measures an electric current received by an electronic device from an input terminal, The current measuring apparatus includes a first voltage accumulator that accumulates a reference supply voltage that acts as a reference for a v |
| 7574633 |
Test apparatus, adjustment method and recording medium |
August 11, 2009 |
| There is provided a test apparatus that tests a device under test including a plurality of data terminals and a clock output terminal, the test apparatus including a plurality of first variable delay circuits that delays a reference clock, a plurality of timing clock generating secti |
| 7574316 |
Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconduc |
August 11, 2009 |
| A semiconductor test apparatus to test a semiconductor circuit includes a pattern generator which generates a test pattern for testing the semiconductor circuit, a waveform shaper which shapes a test signal to be supplied to the semiconductor circuit based on the test pattern, a pulse |
| 7564897 |
Jitter measuring apparatus, jitter measuring method and PLL circuit |
July 21, 2009 |
| A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an |
| 7558327 |
Pattern position measuring device, method, and program, and record medium on which the program i |
July 7, 2009 |
| The position of a specific pattern such as a known symbol in a signal such as an OFDM signal is estimated with high accuracy. An effective symbol extraction section extracts a known symbol (preamble) as an effective symbol from a signal to be measured according to an approximate position |
| 7557561 |
Electronic device, circuit and test apparatus |
July 7, 2009 |
| There is provided an electronic device for receiving an input data signal and an input clock signal that indicates a timing to obtain the input data signal. The electronic device includes a first adjusting section that adjusts a phase difference between the input data signal and the |
| 7557560 |
Timing generator and test device |
July 7, 2009 |
| There is provided a timing generator for generating a timing signal based on a given reference clock, having a delaying circuit section for outputting each pulse of the reference clock by delaying by a value of delay given per each of the pulse and a pulse selecting and outputting se |
| 7557357 |
D/A conversion device and method and charged particle beam exposure apparatus and method |
July 7, 2009 |
| The present invention is related to a D/A conversion device, it is provided with a first D/A conversion circuit which receives input of digital data composed of plural bits and outputs a corresponding electric output signal, and a second D/A conversion circuit which receives input of |
| 7555038 |
Transmission system, signal receiver, test apparatus and test head |
June 30, 2009 |
| A transmission system for transmitting a transmission signal, includes a section for outputting a periodic clock having a preset period, a section for transmitting the transmission signal in synchronism with the periodic clock, and a section for receiving the transmission signal transmit |
| 7554350 |
Burn-in system with heating blocks accommodated in cooling blocks |
June 30, 2009 |
| A burn-in system enabling the temperatures of a large number of electronic devices differing in amount of self generated heat to be simultaneously reliably adjusted to a predetermined temperature, that is, a burn-in system bringing heater blocks having heaters, cooling blocks formed with |
| 7554332 |
Calibration apparatus, calibration method, testing apparatus, and testing method |
June 30, 2009 |
| There is provided a calibration apparatus for calibrating an electronic device that outputs a demodulation signal in which a modulated component of a signal to be tested or evaluated is demodulated, having a DC component detecting section for detecting a DC component of the demodulat |
