Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Active Impulse Systems, Inc. Patents
Assignee:
Active Impulse Systems, Inc.
Address:
Natick, MA
No. of patents:
6
Patents:












Patent Number Title Of Patent Date Issued
6348967 Method and device for measuring the thickness of opaque and transparent films February 19, 2002
A method for determining the thickness of a thin sample is described. The method includes the step of exciting time-dependent acoustic waveguide modes in the sample with an excitation radiation field. The acoustic waveguide modes are detected by diffracting probe radiation off a ripple
6256100 Method and device for measuring the thickness of thin films near a sample's edge and in a damasc July 3, 2001
A method for measuring a structure that contains overlying and underlying films in a region where the overlying film's thickness rapidly decreases until the underlying film is exposed (e.g., an edge-exclusion structure). The method includes the steps of: (1) exciting acoustic modes in a
6081330 Method and device for measuring the thickness of opaque and transparent films June 27, 2000
A method for determining the thickness of a thin sample is described. The method includes the step of exciting time-dependent acoustic waveguide modes in the sample with an excitation radiation field. The acoustic waveguide modes are detected by diffracting probe radiation off a ripple
6075602 Method and apparatus for measuring material properties using transient-grating spectroscopy June 13, 2000
The invention provides an apparatus for measuring a property of a sample (using, e.g., ISTS) that includes: 1) an excitation laser that generates an excitation laser beam; 2) an optical system aligned along an optical axis that separates the excitation laser beam into at least three
6069703 Method and device for simultaneously measuring the thickness of multiple thin metal films in a m May 30, 2000
An apparatus for measuring a property of a structure comprising at least one layer, the appratus including a light source that produces an optical pulse having a duration of less than 10 ps; a diffractive element that receives the optical pulse and diffracts it to generate at least two
5812261 Method and device for measuring the thickness of opaque and transparent films September 22, 1998
A method for determining the thickness of a thin sample is described. The method includes the step of exciting time-dependent acoustic waveguide modes in the sample with an excitation radiation field. The acoustic waveguide modes are detected by diffracting probe radiation off a ripple

 
 
  Recently Added Patents
Nanogap device for field enhancement and a system for nanoparticle detection using the same
Golf club cover
Isolated Australian coral reef fluorescent proteins and cell-based kinase or phosphatase platforms for cancer drug development
Method and system for expanding axial coverage in iterative reconstruction in computer tomography (CT)
Electrophoresis display having touch screen and method for driving the touch screen
Image forming apparatus, information processing method, and storage medium for generating screen information
Combining seismic data from sensors to attenuate noise
  Randomly Featured Patents
System and method for a virtual soft handover in a high data rate network based on data transmission information
Protective device for an inertia wheel rotating
Margin setter for use with a typewriter or printer
Microcomputer and method for controlling memory access
Method and system for performing speech recognition for an internet appliance using a remotely located speech recognition application
Driving force distribution control system for four wheel drive vehicle
Multi-chip module having an improved heat dissipation efficiency
Method and apparatus for hard copy control using automatic sensing devices
Processing set for processing and treating a biological fluid
Typewriter